Generation and Proof of Elliptically Polarized X-Rays

Using an arrangement being analogous to optics of visible light the phase relation of the mutually perpendicularly polarized wave fields are examined in the Laue case of X-ray diffraction. Bragg reflections at an angle of reflection of about 45° are used as polarizer and analyzer. The different phase relations result from different thicknesses of a wedge-shaped silicon crystal, which is placed between the polarizer and the analyzer and adjusted for the symmetric 220-CiiKai-Laue case. The determined polarization states produced by coherent excitation of both cr-polarized and rr-polarized waves in the silicon crystal coincide very well with calculations of the dynamical theory of X-ray diffraction.